WA-1600/1100 Wavemeter® Wavelength Meter

WA-1600/1100 Wavemeter® Wavelength Meter

The most precise wavelength characterization of WDM components
Absolute optical wavelength measured to the highest accuracy of ±0.2ppm
Continuous calibration with internal HeNe laser wavelength standard
Simultaneous measurement of total optical power

The WA-1600 and WA-1100 Wavemeter Optical Wavelength Meters provide the highest accuracy wavelength measurement, simultaneous power measurement, and are designed specifically for characterization of WDM components in manufacturing environments.

These systems employ Burleigh's proven scanning Michelson interferometer-based Wavemeter technology to determine the absolute wavelength of a test laser by comparing its interference fringe pattern with that of a built-in HeNe laser wavelength standard. Unlike other wavelength meters, all factors that can affect wavelength measurement are accounted for in order to achieve the highest absolute wavelength accuracy of ± 0.2 ppm with the WA-1600. When the highest accuracy is not required, the WA-1100 is an affordable alternative measuring absolute wavelength to ± 1 ppm.

To provide a more complete analysis of WDM components, these Wavemeters simultaneously measure the total power of an optical input signal. In addition, a Drift feature automatically monitors as a function of time any changes in wavelength or power. Current values and their deviation from the measurement starting point are displayed to provide the real-time status of the test laser. The maximum and minimum values are also reported to give the limits reached during measurement.

Several design considerations specific to the needs of WDM component manufacturers have been incorporated in these systems. With a built-in HeNe laser wavelength standard, the system's accuracy is maintained over long periods of time without the need for calibration. The efficiency of wavelength characterization is enhanced with measurement cycle time as short as 0.1 second. And a rugged benchtop or rack mounted package minimizes any detrimental effects from a typical manufacturing environment.

Specifications

	WA-1600	WA-1100
Wavelength
Range	700 – 1700 nm (181 – 428 THz)
Absolute Accuracy	± 0.2 ppm ^a ± 0.3 nm @ 1500 nm ± 0.26 nm @ 1300 nm	± 1 ppm ^b ± 1.5 nm @ 1500 nm ± 1.3 nm @ 1300 nm
Display Resolution	0.1 pm	1 pm
Units	nm (vacuum or standard air), cm^-1, GHz
Power
Absolute Accuracy	± 0.5 dB ( at ± 30 nm from 780, 1310 and 1550 nm )
Display Resolution	0.01 dB
Units	dBm, mW, µW
Optical Input Signal
Sensitivity (1200-1650 nm)	-30 dBm ( 1 µW )
Sensitivity (700-1200 nm)	-20 dBm (10 µW)
Maximum Input Level	10 dBm (10mW)
Measurement Update
Time (Rate)	1s (1 measurement/s)	0.1s (10 measurement/s)
Inputs/Outputs
Optical Input	FC/PC connector standard FC/APC connector optional
Instrument Interface	RS-232, GPIB (IEEE-488.2)

Notes:

a.	Accuracy of ± 0.2 ppm is achieved when laser spectral bandwidth is less than 1 GHz (FWHM). When spectral bandwidth is greater than 1 GHz, the wavelength measurement is displayed with the appropriately reduced accuracy.
b.	Accuracy of ± 1.0 ppm is achieved when laser spectral bandwidth is less than 10 GHz (FWHM). When spectral bandwidth is greater than 10 GHz, the wavelength measurement is displayed with the appropriately reduced accuracy.